Contents
2022
Volume: 52 Issue 1
29 Article(s)

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[in Chinese]
[in Chinese]
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 1 (2022)
[in Chinese]
FPGA Design and Implementation of a Large Integer Multiplier with High Speed Pipeline Structure
TU Zhenxing, WANG Xiaolei, DU Gaoming, and LI Zhenmin
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 6 (2022)
A High Frequency Voltage Controlled Active Inductor with Multiple Reconfigurable Performances
LI Bai, ZHANG Wanrong, XIE Hongyun, JIN Dongyue, NA Weicong, LI Yikang, and KANG Yilin
A high frequency voltage controlled active inductor (HFVCAI) with multiple reconfigurable performances was proposed, which was mainly composed of a first gyration loop, a second gyration loop and a tuning branch circuit. And the first gyration loop was in parallel with the second gyration loop, and the tuning branch ci
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 22 (2022)
Design of a S-Band Class-E GaN HEMT Power Amplifier
WANG Deyong, ZHANG Panpan, ZHANG Jincan, LIU Min, LIU Bo, and SUN Ligong
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 28 (2022)
A High Speed Word Line Drive Circuit for Compute-in-Memory
WANG Yutong, YU Zhiguo, CHE Rao, and GU Xiaofeng
In non-volatile compute-in-memory (CIM) chips, the gate equivalent capacitance of large-scale array and the equivalent capacitance of long-distance transmission line severely restricted the switching speed of word line drive circuit (WLDC). The different voltage of multi-voltage range required by the nonvolatile CIM de
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 47 (2022)
Design of a RO PUF Based on FPGA Carry Logic
CHEN Peng, LI Xiandong, YAO Liang, YI Maoxiang, and LU Yingchun
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 65 (2022)
[in Chinese]
A Novel Latch-Immune LDMOS for High-Voltage Protection
SUN Haonan, WANG Junchao, LI Haoliang, and ZHANG Yingtao
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 77 (2022)
A Latch-Up Immunity Multi-Embedded-Well SCR ESD Device
HOU Jiali, HU Yi, HE Junmin, and WANG Yuan
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 91 (2022)
[in Chinese]
Research on Optimal FBGA Solder Joints Reliability Based on Orthogonal Method
SUN Qinrun, YANG Xuexia, ZHANG Weiwei, WANG Chao, LIU Zhaoyun, and PENG Yinfei
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 144 (2022)
Statistical Analysis of Total Ionizing Dose Effect on Flash Memory Floating Gate Cells
LIANG Runcheng, CHEN Faguo, GUO Rong, HAN Yi, LIU Zhaoxing, ZHANG Jing, and ZHAO Ri
Microelectronics
  • Publication Date: Jan. 15, 2022
  • Vol. 52 Issue 1 150 (2022)