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Microelectronics

Co-Editors-in-Chief

Xiaojun Fu

CN

CN50-1090/TN

ISSN

1004-3365

Frequency

Bimonthly issues

Study on Total-Ionizing-Dose Radiation Induced BV Degradation of High Voltage SOI pLDMOS

MicroelectronicsVol. 52, Issue 4 (2022)

A Short Circuit Current Limiting and Protection Circuit for High Side Switches

MicroelectronicsVol. 52, Issue 4 (2022)

Research on Ultrasonic Detection and Validity Verification of LTCC Filter Micro-Delamination

MicroelectronicsVol. 52, Issue 4 (2022)

Design and Verification of a High Performance Second-Order Charge-Controlled Memristor Circuit

MicroelectronicsVol. 52, Issue 4 (2022)

A High Efficiency Boost Converter Chip with MPPT Function for PV Cell

MicroelectronicsVol. 52, Issue 4 (2022)

Top Downloads

Research on the Development Trends of Radiation Hardened Technology

Microelectronics
Vol. 52, Issue 2, 197 (2022)

Review of Digital Calibration Techniques Based on Neural Network

Microelectronics
Vol. 52, Issue 2, 191 (2022)

Research Progress of Analog-to-Digital Converters for Image Sensors

Microelectronics
Vol. 52, Issue 2, 181 (2022)

A Multiband Low Noise Amplifier Based on Tunable Active Inductor

Microelectronics
Vol. 51, Issue 2, 151 (2021)

A Novel Low Power Radiation Hardened SRAM Memory Cell

Microelectronics
Vol. 51, Issue 2, 157 (2021)

A Low Loss High Isolation Millimeter Wave SPDT Switch

Microelectronics
Vol. 51, Issue 2, 216 (2021)