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Journals >Microelectronics

Microelectronics

Editors-in-Chief

Xiaojun Fu

CN

CN50-1090/TN

ISSN

1004-3365

Frequency

Bimonthly issues

Research on Spatter of Solder Bead in Vacuum Reflow Soldering Circuits

MicroelectronicsVol. 55, Issue 4 (2025)

Thermal Design of Magnetic Devices for High Power Hybrid Integrated DC/DC Converters

MicroelectronicsVol. 55, Issue 4 (2025)

Research on Laser Grooving Process and Reliability of Low-K Chips

MicroelectronicsVol. 55, Issue 4 (2025)

Physical Mechanisms of Reliability Degradation in SiC MOSFET Devices under Bias Temperature Stress

MicroelectronicsVol. 55, Issue 4 (2025)

Quantitative Theory for Three-Dimensional Electron Gas of PolFET

MicroelectronicsVol. 55, Issue 4 (2025)

Top Downloads

A NS SAR ADC with kT/C Noise Cancellation and Mismatch Error Shaping

FU Jianjun, YI Tiange, LIU Jiaxin, and JIANG Hequan

Microelectronics
Vol. 55, Issue 1, 114 (2025)

Investigation of Single Event Transient Effects in InP-based HEMT

SUN Shuxiang, LI Haoyu and ZHANG Xin

Microelectronics
Vol. 55, Issue 1, 21 (2025)

SEFI Characterization of High Speed JESD204B Interface Digital-to-analog Converter

LI Jing, JIANG Wei, LIU Jun, YU Zhou, WEN Xianchao, WANG Jianan, GUO Gang, SUN Yi, and WANG Tianqi

Microelectronics
Vol. 55, Issue 1, 34 (2025)

Impact of Leakage Degradation Damage Caused by Heavy Ions on the Gate Reliability of SiC MOSFETs

YUAN Qifei, YU Qingkui, CAO Shuang, SUN Yi, WANG He, ZHANG Xiao, ZHANG Teng, and BAI Song

Microelectronics
Vol. 55, Issue 1, 9 (2025)

A Novel Self-clamping P-shield Low Specific On-resistance SiC MOSFET

KONG Moufu, ZHAO Liang, AI Zhaoyu, CHENG Zeyu, and DENG Hongfei

Microelectronics
Vol. 55, Issue 1, 140 (2025)

A Radiation-hardening and Wide-input-range Bandgap Reference

LI Chengxin, LUO Ping, FENG Jiekai, GONG Zheng, LUO Kai, and YAO Fulin

Microelectronics
Vol. 55, Issue 1, 46 (2025)