• Journal of Semiconductors
  • Vol. 40, Issue 12, 122401 (2019)
Raheela Rasool, Najeeb-ud-Din, and G. M. Rather
Author Affiliations
  • Department of Electronics and Communication, National Institute of Technology, Srinagar, Jammu & Kashmir, India
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    DOI: 10.1088/1674-4926/40/12/122401 Cite this Article
    Raheela Rasool, Najeeb-ud-Din, G. M. Rather. Analytical model for the effects of the variation of ferrolectric material parameters on the minimum subthreshold swing in negative capacitance capacitor[J]. Journal of Semiconductors, 2019, 40(12): 122401 Copy Citation Text show less
    (a) Schematic of MFMIS based NC-FET. (b) Equivalent capacitance divider.
    Fig. 1. (a) Schematic of MFMIS based NC-FET. (b) Equivalent capacitance divider.
    Voltage-charge plot for a ferroelectric material.
    Fig. 2. Voltage-charge plot for a ferroelectric material.
    (a) Capacitance versus charge plots for MOS capacitor, ferroelectric capacitor and the total capacitance of MFMIS capacitor. (b) Voltage charge plot of the MFMIS capacitor.
    Fig. 3. (a) Capacitance versus charge plots for MOS capacitor, ferroelectric capacitor and the total capacitance of MFMIS capacitor. (b) Voltage charge plot of the MFMIS capacitor.
    ParameterPZT[20]BaTiO3[15]SBT[15]HfSiO[22]P(VDF-TrFE)[23]
    α (cm/F) –2.25 × 109–5 × 108–3.25 × 109–8.65 × 1010–1.8 × 1011
    β (cm3/F/C2) 1.3 × 10182.2 × 10189.37 × 10181.92 × 10205.8 × 1022
    γ (cm5/F/C4) 9.83 × 10257.5 × 1027000
    NA (cm–3) 2.3 × 10203.3 × 10207.5 × 10195.7 × 10194 × 1018
    tox (nm) 22222
    tFE (nm) 22.319.315.55.82.8
    Smin (mV/dec) 52.846.541.63127
    Table 1. Ferroelectric thickness (tFE) and minimum subthreshold swing (Smin) for different ferroelectric materials.
    Raheela Rasool, Najeeb-ud-Din, G. M. Rather. Analytical model for the effects of the variation of ferrolectric material parameters on the minimum subthreshold swing in negative capacitance capacitor[J]. Journal of Semiconductors, 2019, 40(12): 122401
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