Articles
Janus VXY monolayers with tunable large Berry curvature
Liu Wenrong, Li Xinyang, Zhang Changwen, and Yan Shishen
Journal of Semiconductors
  • Apr. 25, 2022
  • Vol.43, Issue 4 (2022)
Articles
DASP: Defect and Dopant ab-initio Simulation Package
Huang Menglin, Zheng Zhengneng, Dai Zhenxing, Guo Xinjing, Wang Shanshan, Jiang Lilai, Wei Jinchen, and Chen Shiyou
Journal of Semiconductors
  • Apr. 25, 2022
  • Vol.43, Issue 4 (2022)
Reviews
Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors
Journal of Semiconductors
  • Apr. 25, 2022
  • Vol.43, Issue 4 (2022)
Reviews
Structural evolution of low-dimensional metal oxide semiconductors under external stress
Zhao Peili, Li Lei, Chen Guoxujia, Guan Xiaoxi, Zhang Ying, Meng Weiwei, Zhao Ligong, Li Kaixuan, Jiang Renhui, Jia Shuangfeng, Zheng He, and Wang Jianbo
Journal of Semiconductors
  • Apr. 25, 2022
  • Vol.43, Issue 4 (2022)
Reviews
In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processes
Fang Zhen, Liu Yao, Song Chengyi, Tao Peng, Shang Wen, Deng Tao, Zeng Xiaoqin, and Wu Jianbo
Journal of Semiconductors
  • Apr. 25, 2022
  • Vol.43, Issue 4 (2022)
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