Journals >Journal of Semiconductors
Janus VXY monolayers with tunable large Berry curvature
DASP: Defect and Dopant ab-initio Simulation Package
Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors
Structural evolution of low-dimensional metal oxide semiconductors under external stress
In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processes