• Journal of Semiconductors
  • Vol. 40, Issue 12, 122403 (2019)
Buqing Xu1、3, Qiang Wu2, Lisong Dong3, and Yayi Wei1、3
Author Affiliations
  • 1University of Chinese Academy of Sciences, Beijing 100049, China
  • 2Shanghai Integrated Circuit Research & Development Center, Shanghai 201210, China
  • 3Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
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    DOI: 10.1088/1674-4926/40/12/122403 Cite this Article
    Buqing Xu, Qiang Wu, Lisong Dong, Yayi Wei. Selection of DBO measurement wavelength for bottom mark asymmetry based on FDTD method[J]. Journal of Semiconductors, 2019, 40(12): 122403 Copy Citation Text show less
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    Buqing Xu, Qiang Wu, Lisong Dong, Yayi Wei. Selection of DBO measurement wavelength for bottom mark asymmetry based on FDTD method[J]. Journal of Semiconductors, 2019, 40(12): 122403
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