• Journal of Semiconductors
  • Vol. 41, Issue 7, 072904 (2020)
Fuyou Liao1、4, Hongjuan Wang2、3, Xiaojiao Guo1, Zhongxun Guo1, Ling Tong1, Antoine Riaud1, Yaochen Sheng1, Lin Chen1, Qingqing Sun1, Peng Zhou1, David Wei Zhang1, Yang Chai4、5, Xiangwei Jiang3, Yan Liu2, and Wenzhong Bao1
Author Affiliations
  • 1State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, China
  • 2State Key Discipline Laboratory of Wide Bandgap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an 710071, China
  • 3Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 4The Hong Kong Polytechnic University Shenzhen Research Institute, Shenzhen 518057, China
  • 5Department of Applied Physics, The Hong Kong Polytechnic University, Hong Kong, China
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    DOI: 10.1088/1674-4926/41/7/072904 Cite this Article
    Fuyou Liao, Hongjuan Wang, Xiaojiao Guo, Zhongxun Guo, Ling Tong, Antoine Riaud, Yaochen Sheng, Lin Chen, Qingqing Sun, Peng Zhou, David Wei Zhang, Yang Chai, Xiangwei Jiang, Yan Liu, Wenzhong Bao. Charge transport and quantum confinement in MoS2 dual-gated transistors[J]. Journal of Semiconductors, 2020, 41(7): 072904 Copy Citation Text show less
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    Fuyou Liao, Hongjuan Wang, Xiaojiao Guo, Zhongxun Guo, Ling Tong, Antoine Riaud, Yaochen Sheng, Lin Chen, Qingqing Sun, Peng Zhou, David Wei Zhang, Yang Chai, Xiangwei Jiang, Yan Liu, Wenzhong Bao. Charge transport and quantum confinement in MoS2 dual-gated transistors[J]. Journal of Semiconductors, 2020, 41(7): 072904
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