Quantitative Phase Microscopy with High Stability

Kai Wen; Ying Ma; Meiling Zhang; Yu Wang; Chi Fu; Juanjuan Zheng; Lixin Liu; Peng Gao; Baoli Yao

doi:10.3788/LOP57.200001

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 20 >Page 200001 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 20, 200001 (2020)

Quantitative Phase Microscopy with High Stability

Kai Wen¹, Ying Ma¹, Meiling Zhang¹, Yu Wang¹, Chi Fu¹, Juanjuan Zheng¹, Lixin Liu¹, Peng Gao^1、*, and Baoli Yao²

Author Affiliations

¹School of Physics and Optoelectronic Engineering, Xidian University, Xi'an, Shaanxi 710071, China

²State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, Shaanxi 710119, China

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DOI: 10.3788/LOP57.200001 Cite this Article Set citation alerts

Kai Wen, Ying Ma, Meiling Zhang, Yu Wang, Chi Fu, Juanjuan Zheng, Lixin Liu, Peng Gao, Baoli Yao. Quantitative Phase Microscopy with High Stability[J]. Laser & Optoelectronics Progress, 2020, 57(20): 200001 Copy Citation Text

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