• Journal of Semiconductors
  • Vol. 41, Issue 10, 102401 (2020)
Elyes Garoudja1, Walid Filali1, Slimane Oussalah2, Noureddine Sengouga3, and Mohamed Henini4
Author Affiliations
  • 1Plateforme Technologique de Microfabrication, Centre de Développement des Technologies Avancées, cité 20 août 1956, Baba Hassen, Algiers, Algeria
  • 2Microelectronics and Nanotechnology Division, Centre de Développement des Technologies Avancées, cité 20 août 1956, Baba Hassen, Algiers, Algeria
  • 3Laboratory of Metallic and Semiconducting Materials, Université de Biskra, B.P 455, 07000 Biskra RP, Algeria
  • 4School of Physics and Astronomy, Nottingham Nanotechnology and Nanoscience Center, University of Nottingham, Nottingham, NG7 2RD, UK
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    DOI: 10.1088/1674-4926/41/10/102401 Cite this Article
    Elyes Garoudja, Walid Filali, Slimane Oussalah, Noureddine Sengouga, Mohamed Henini. Comparative study of various methods for extraction of multi- quantum wells Schottky diode parameters[J]. Journal of Semiconductors, 2020, 41(10): 102401 Copy Citation Text show less
    References

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    [2] J H Werner. Schottky barrier and pn-junction I/V plots—Small signal evaluation. Appl Phys A, 47, 291(1988).

    [3] Ş Karataş, Ş Altındal. Temperature dependence of barrier heights of Au/n-type GaAs Schottky diodes. Solid-State Electron, 49, 1052(2005).

    [4] İ Dökme, Ş Altindal, M M Bülbül. The barrier height inhomogeneity in Al/p-Si Schottky barrier diodes with native insulator layer. Appl Surf Sci, 252, 7749(2006).

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    [16] W Filali, N Sengouga, S Oussalah et al. Characterisation of temperature dependent parameters of multi-quantum well (MQW) Ti/Au/n-AlGaAs/n-GaAs/n-AlGaAs Schottky diodes. Superlattices Microstruct, 111, 1010(2017).

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    Elyes Garoudja, Walid Filali, Slimane Oussalah, Noureddine Sengouga, Mohamed Henini. Comparative study of various methods for extraction of multi- quantum wells Schottky diode parameters[J]. Journal of Semiconductors, 2020, 41(10): 102401
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