• Journal of Semiconductors
  • Vol. 40, Issue 4, 042101 (2019)
Guiying Shen1, Youwen Zhao1、2, Yongbiao Bai1, Jingming Liu1, Hui Xie1, Zhiyuan Dong1, Jun Yang1, and Ding Yu1、2
Author Affiliations
  • 1Key Laboratory of Semiconductor Materials Science and Beijing Key Laboratory of Low-Dimensional Semiconductor Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.1088/1674-4926/40/4/042101 Cite this Article
    Guiying Shen, Youwen Zhao, Yongbiao Bai, Jingming Liu, Hui Xie, Zhiyuan Dong, Jun Yang, Ding Yu. Photoluminescene study acceptor defects in lightly doped n type GaSb single crystals[J]. Journal of Semiconductors, 2019, 40(4): 042101 Copy Citation Text show less
    (Color online) PL spectra of p-type GaSb samples measured at 10 K.
    Fig. 1. (Color online) PL spectra of p-type GaSb samples measured at 10 K.
    (Color online) PL spectra of sample 2 at 10 K.
    Fig. 2. (Color online) PL spectra of sample 2 at 10 K.
    (Color online) PL spectra of samples 1, 3 and 4 at 10 K.
    Fig. 3. (Color online) PL spectra of samples 1, 3 and 4 at 10 K.
    (Color online) PL spectra of samples 5, 6 and 7 at 10 K.
    Fig. 4. (Color online) PL spectra of samples 5, 6 and 7 at 10 K.
    Sample No.Mobility (cm2/(V·s)) Carrier concentration (cm−3) Type
    12.34 × 1031.66 × 1016n
    22.83 × 1032.79 × 1016n
    32.94 × 1035.24 × 1016n
    42.96 × 1036.63 × 1016n
    53.04 × 1037.84 × 1016n
    63.34 × 1031.14 × 1017n
    73.24 × 1031.38 × 1017n
    86.41 × 1021.41 × 1017p
    97.39 × 1021.14 × 1017p
    Table 1. Hall results of n-type Te-GaSb sample at room temperature.
    Energy (meV)TransitionQuota
    812Band gapRef. [19] (4.2 K)
    810Free excitonRef. [20] (20 K)
    808Excitonic transitionRef. [18] (19 K)
    802Donor-acceptor transitionRef. [19] (4.2 K)
    797Excitonic transitionRef. [18] (19 K)
    796, 792Exciton band to (VGa GaSb)0Ref. [19] (4.2 K)
    781C-(VGa GaSb)0Ref. [19] (4.2 K)
    777D+-(VGa GaSb)0Ref. [19] (4.2 K)
    765LO phonon replica of 796 meV transitionRef. [18] (19 K)
    760Acceptor BRef. [18] (19 K)
    756Exciton band to GaSbRef. [5] (10 K)
    746, 740LO phonon replica of 777 meVRef. [19] (4.2 K)
    738C-(VGa GaSb TeSb) Ref. [18] (19 K)
    710C-(VGa GaSb) Ref. [19] (4.2 K)
    682LO phonon replica of 710 meVRef. [19] (4.2 K)
    Table 2. The PL peak position and related transition of GaSb reported in the literature.
    Sample No.Peak positionStrength of peak GPeak positionStrength of peak CPeak positionStrength of peak T
    16650.656831.267031.73
    26640.526831.437061.68
    36640.436851.527081.53
    46650.426861.587071.56
    56660.126920.927121.59
    67000.837211.76
    77120.757321.98
    Table 3. The position (meV) and intensity (a.u.) of resolved peak G, C and T.
    Guiying Shen, Youwen Zhao, Yongbiao Bai, Jingming Liu, Hui Xie, Zhiyuan Dong, Jun Yang, Ding Yu. Photoluminescene study acceptor defects in lightly doped n type GaSb single crystals[J]. Journal of Semiconductors, 2019, 40(4): 042101
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