Hybrid brightfield and darkfield transport of intensity approach for high-throughput quantitative phase microscopy

Linpeng Lu; Jiaji Li; Yefeng Shu; Jiasong Sun; Jie Zhou; Edmund Y. Lam; Qian Chen; Chao Zuo

doi:10.1117/1.AP.4.5.056002

Journals >Advanced Photonics >Volume 4 >Issue 5 >Page 056002 > Article

Advanced Photonics
Vol. 4, Issue 5, 056002 (2022)

Hybrid brightfield and darkfield transport of intensity approach for high-throughput quantitative phase microscopy | Author Presentation

Linpeng Lu^1,2,3,4,†, Jiaji Li^1,2,3,4, Yefeng Shu^1,2,3,4, Jiasong Sun^1,2,3,4..., Jie Zhou^1,2,3,4, Edmund Y. Lam^5,*, Qian Chen^2,3,* and Chao Zuo^1,2,3,4,*|Show fewer author(s)

Author Affiliations

¹Nanjing University of Science and Technology, Smart Computational Imaging Laboratory (SCILab), Nanjing, China

²Nanjing University of Science and Technology, School of Electronic and Optical Engineering, Nanjing, China

³Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing, China

⁴Nanjing University of Science and Technology, Smart Computational Imaging Research Institute (SCIRI), Nanjing, China

⁵The University of Hong Kong, Department of Electrical and Electronic Engineering, Pokfulam, Hong Kong, China

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DOI: 10.1117/1.AP.4.5.056002 Cite this Article Set citation alerts

Linpeng Lu, Jiaji Li, Yefeng Shu, Jiasong Sun, Jie Zhou, Edmund Y. Lam, Qian Chen, Chao Zuo, "Hybrid brightfield and darkfield transport of intensity approach for high-throughput quantitative phase microscopy," Adv. Photon. 4, 056002 (2022) Copy Citation Text

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