Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting

Yuchen Chen; Chuankang Li; Xiang Hao; Cuifang Kuang; Xu Liu

doi:10.3788/LOP57.180001

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 18 >Page 180001 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 18, 180001 (2020)

Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting

Yuchen Chen¹, Chuankang Li¹, Xiang Hao¹, Cuifang Kuang^{1、2、3、*}, and Xu Liu^1、2

Author Affiliations

¹State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China

²Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 0 30006, China

³Ningbo Research Institute, Zhejiang University, Ningbo, Zhejiang 315100, China

show less

DOI: 10.3788/LOP57.180001 Cite this Article Set citation alerts

Yuchen Chen, Chuankang Li, Xiang Hao, Cuifang Kuang, Xu Liu. Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting[J]. Laser & Optoelectronics Progress, 2020, 57(18): 180001 Copy Citation Text

show less

Cited By

Article index updated: May. 19, 2024

Citation counts are provided from Researching.

The article is cited by 4 article(s) from Researching.