• Laser & Optoelectronics Progress
  • Vol. 57, Issue 18, 180001 (2020)
Yuchen Chen1, Chuankang Li1, Xiang Hao1, Cuifang Kuang1、2、3、*, and Xu Liu1、2
Author Affiliations
  • 1State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China
  • 2Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, Shanxi 0 30006, China
  • 3Ningbo Research Institute, Zhejiang University, Ningbo, Zhejiang 315100, China
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    DOI: 10.3788/LOP57.180001 Cite this Article Set citation alerts
    Yuchen Chen, Chuankang Li, Xiang Hao, Cuifang Kuang, Xu Liu. Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting[J]. Laser & Optoelectronics Progress, 2020, 57(18): 180001 Copy Citation Text show less

    Abstract

    The resolution of conventional optical microscopes is limited to about half of the wavelength of illumination light due to the optical diffraction limit, which severely limits the observation of finer structures in biological and material research fields. As the most typical and earliest point scanning microscopy, the confocal microscopy has become the most widely used optical microscopy with good optical slicing ability and high signal-to-noise ratio. However, due to the limited cut-off frequency of the confocal microscopy, the improvement of resolution is also limited. Frequency shifting technique aims to move the higher frequency information to the observable frequency range, so as to improve the resolution of point scanning microscopy. In this review, the basic principle, advantages, and disadvantages of point scanning frequency shifting super-resolution imaging technology are introduced in detail, and its prospect is also given.
    Yuchen Chen, Chuankang Li, Xiang Hao, Cuifang Kuang, Xu Liu. Progress of Point Scanning Super-Resolution Microscopy Based on Frequency Shifting[J]. Laser & Optoelectronics Progress, 2020, 57(18): 180001
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