• Journal of Semiconductors
  • Vol. 43, Issue 4, 041101 (2022)
Sai Jiang1, Qinyong Dai2, Jianhang Guo2, and Yun Li2
Author Affiliations
  • 1School of Microelectronics and Control Engineering, Changzhou University, Changzhou 213164, China
  • 2National Laboratory of Solid-State Microstructures, School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
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    DOI: 10.1088/1674-4926/43/4/041101 Cite this Article
    Sai Jiang, Qinyong Dai, Jianhang Guo, Yun Li. In-situ/operando characterization techniques for organic semiconductors and devices[J]. Journal of Semiconductors, 2022, 43(4): 041101 Copy Citation Text show less
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    Sai Jiang, Qinyong Dai, Jianhang Guo, Yun Li. In-situ/operando characterization techniques for organic semiconductors and devices[J]. Journal of Semiconductors, 2022, 43(4): 041101
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