Electro-Static Failure Evolution of GaN-Based LED Thin Film Chip with Ag Mirrors

Shibiao Liu; Guangxu Wang; Xiaoming Wu; Chunlan Mo; Jiangli Zhang

doi:10.3788/AOS202040.1023001

Journals >Acta Optica Sinica >Volume 40 >Issue 10 >Page 1023001 > Article

Acta Optica Sinica
Vol. 40, Issue 10, 1023001 (2020)

Electro-Static Failure Evolution of GaN-Based LED Thin Film Chip with Ag Mirrors

Shibiao Liu, Guangxu Wang^*, Xiaoming Wu, Chunlan Mo, and Jiangli Zhang

Author Affiliations

National Institute of LED on Silicon Substrate, Nanchang University, Nanchang, Jiangxi 330096, China

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DOI: 10.3788/AOS202040.1023001 Cite this Article Set citation alerts

Shibiao Liu, Guangxu Wang, Xiaoming Wu, Chunlan Mo, Jiangli Zhang. Electro-Static Failure Evolution of GaN-Based LED Thin Film Chip with Ag Mirrors[J]. Acta Optica Sinica, 2020, 40(10): 1023001 Copy Citation Text

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Shibiao Liu, Guangxu Wang, Xiaoming Wu, Chunlan Mo, Jiangli Zhang. Electro-Static Failure Evolution of GaN-Based LED Thin Film Chip with Ag Mirrors[J]. Acta Optica Sinica, 2020, 40(10): 1023001

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