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    Journals >Acta Optica Sinica >Volume 40 >Issue 1 >Page 0111023 > Article
    • Acta Optica Sinica
    • Vol. 40, Issue 1, 0111023 (2020)
    Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image
    Fupei Wu, Shukai Zhu, and Shengping Li*
    Author Affiliations
  • Key Laboratory of Intelligent Manufacturing Technology, Ministry of Education, Shantou University, Shantou, Guangdong 515063, China
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    DOI: 10.3788/AOS202040.0111023 Cite this Article Set citation alerts
    Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023 Copy Citation Text show less
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    Article index updated: May. 18, 2024
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    Fupei Wu, Shukai Zhu, Shengping Li. Coplanarity Inspection Method for Integrated Circuit Pins Based on Single Image[J]. Acta Optica Sinica, 2020, 40(1): 0111023
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    Paper Information
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