• Journal of Semiconductors
  • Vol. 42, Issue 12, 122902 (2021)
Peng Teng1、2、3, Tong Zhou4, Yonghuan Wang2、3, Ke Zhao1, Xiegang Zhu2、3, and Xinchun Lai2
Author Affiliations
  • 1Southwest Jiaotong University, School of Physical Science and Technology, Chengdu 610031, China
  • 2Science and Technology on Surface Physics and Chemistry Laboratory, Jiangyou 621908, China
  • 3Institute of Materials, China Academy of Engineering Physics, Mianyang 621700, China
  • 4Beijing Institute for Advanced Study, National University of Defense Technology, Beijing 100020, China
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    DOI: 10.1088/1674-4926/42/12/122902 Cite this Article
    Peng Teng, Tong Zhou, Yonghuan Wang, Ke Zhao, Xiegang Zhu, Xinchun Lai. Electrical transport properties of cerium doped Bi2Te3 thin films grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(12): 122902 Copy Citation Text show less
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    Peng Teng, Tong Zhou, Yonghuan Wang, Ke Zhao, Xiegang Zhu, Xinchun Lai. Electrical transport properties of cerium doped Bi2Te3 thin films grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(12): 122902
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