• Journal of Semiconductors
  • Vol. 42, Issue 12, 122902 (2021)
Peng Teng1、2、3, Tong Zhou4, Yonghuan Wang2、3, Ke Zhao1, Xiegang Zhu2、3, and Xinchun Lai2
Author Affiliations
  • 1Southwest Jiaotong University, School of Physical Science and Technology, Chengdu 610031, China
  • 2Science and Technology on Surface Physics and Chemistry Laboratory, Jiangyou 621908, China
  • 3Institute of Materials, China Academy of Engineering Physics, Mianyang 621700, China
  • 4Beijing Institute for Advanced Study, National University of Defense Technology, Beijing 100020, China
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    DOI: 10.1088/1674-4926/42/12/122902 Cite this Article
    Peng Teng, Tong Zhou, Yonghuan Wang, Ke Zhao, Xiegang Zhu, Xinchun Lai. Electrical transport properties of cerium doped Bi2Te3 thin films grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(12): 122902 Copy Citation Text show less

    Abstract

    Introducing magnetism into topological insulators (TIs) can tune the topological surface states and produce exotic physical effects. Rare earth elements are considered as important dopant candidates, due to their large magnetic moments from heavily shielded 4f electrons. As the first element with just one 4f electron, cerium (Ce) offers an ideal platform for exploring the doping effect of f-electron in TIs. Here in this work, we have grown cerium-doped topological insulator Bi2Te3 thin films on an Al2O3(0001) substrate by molecular beam epitaxy (MBE). Electronic transport measurements revealed the Kondo effect, weak anti-localization (WAL) effect and suppression of surface conducting channels by Ce doping. Our research shows the fundamental doping effects of Ce in Bi2Te3 thin films, and demonstrates that such a system could be a good platform for further research.
    ${\rho _{xx}} = {\rho _{\rm{0}}}{\rm{ + }}A {T^2} - B {\rm{log}} T,$(1)

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    $\text{MR} = \frac{{R\left( B \right) - R\left( 0 \right)}}{{R\left( 0 \right)}} \times 100\% ,$(2)

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    $\Delta {G_{xx}}\left( B \right) \equiv G\left( B \right) - G\left( 0 \right) \cong \alpha \frac{{{e^2}}}{{2{\pi ^2}\hbar }}\left[ {\psi \left( {\frac{1}{2} + \frac{{{B_{\phi} }}}{B}} \right) - \ln \left( {\frac{{{B_{\phi} }}}{B}} \right)} \right],$(3)

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    $\alpha = N a,$(4)

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    ${l_{\phi} } = A {T^m},$(5)

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    Peng Teng, Tong Zhou, Yonghuan Wang, Ke Zhao, Xiegang Zhu, Xinchun Lai. Electrical transport properties of cerium doped Bi2Te3 thin films grown by molecular beam epitaxy[J]. Journal of Semiconductors, 2021, 42(12): 122902
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