• Journal of Semiconductors
  • Vol. 41, Issue 12, 122802 (2020)
Wen Gu1、2, Zhibin Liu1、2、3, Yanan Guo1、2、3, Xiaodong Wang1、2、3, Xiaolong Jia4, Xingfang Liu2、5, Yiping Zeng4、5、6, Junxi Wang1、2、3, Jinmin Li1、2、3, and Jianchang Yan1、2、3
Author Affiliations
  • 1Research and Development Center for Solid-State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Beijing Engineering Research Center for the 3rd Generation Semiconductor Materials and Application, Beijing 100083, China
  • 4Advanced Ultraviolet Optoelectronics Co. Ltd, Changzhi 046000, China
  • 5Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 6Youwill Hitech Co. Ltd, Beijing 100083, China
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    DOI: 10.1088/1674-4926/41/12/122802 Cite this Article
    Wen Gu, Zhibin Liu, Yanan Guo, Xiaodong Wang, Xiaolong Jia, Xingfang Liu, Yiping Zeng, Junxi Wang, Jinmin Li, Jianchang Yan. Comprehensive study of crystalline AlN/sapphire templates after high-temperature annealing with various sputtering conditions[J]. Journal of Semiconductors, 2020, 41(12): 122802 Copy Citation Text show less
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    [10] P Dong, J C Yan, J X Wang et al. 282-nm AlGaN-based deep ultraviolet light-emitting diodes with improved performance on nano-patterned sapphire substrates. Appl Phys Lett, 102, 241113(2013).

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    Wen Gu, Zhibin Liu, Yanan Guo, Xiaodong Wang, Xiaolong Jia, Xingfang Liu, Yiping Zeng, Junxi Wang, Jinmin Li, Jianchang Yan. Comprehensive study of crystalline AlN/sapphire templates after high-temperature annealing with various sputtering conditions[J]. Journal of Semiconductors, 2020, 41(12): 122802
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