Intensity diffusion: a concealed cause of fringe distortion in fringe projection profilometry

Zheng Sun; Minghui Duan; Yabing Zheng; Yi Jin; Xin Fan; Jinjin Zheng

doi:10.1364/PRJ.451818

Journals >Photonics Research >Volume 10 >Issue 5 >Page 1210 > Article

Photonics Research
Vol. 10, Issue 5, 1210 (2022)

Intensity diffusion: a concealed cause of fringe distortion in fringe projection profilometry

Zheng Sun^1、†, Minghui Duan^1、†, Yabing Zheng, Yi Jin^*, Xin Fan, and Jinjin Zheng

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Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Hefei 230022, China

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DOI: 10.1364/PRJ.451818 Cite this Article Set citation alerts

Zheng Sun, Minghui Duan, Yabing Zheng, Yi Jin, Xin Fan, Jinjin Zheng. Intensity diffusion: a concealed cause of fringe distortion in fringe projection profilometry[J]. Photonics Research, 2022, 10(5): 1210 Copy Citation Text

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