Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu; Julien Vaillant; Guillaume Montay; Manuel François; Yassine Hadjar; Aurélien Bruyant

doi:10.3788/COL201816.071201

Journals >Chinese Optics Letters >Volume 16 >Issue 7 >Page 071201 > Article

Chinese Optics Letters
Vol. 16, Issue 7, 071201 (2018)

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu^1,*, Julien Vaillant^1,2, Guillaume Montay², Manuel François²..., Yassine Hadjar¹ and Aurélien Bruyant^1,**|Show fewer author(s)

Author Affiliations

¹ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

²ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

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DOI: 10.3788/COL201816.071201 Cite this Article Set citation alerts

Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018) Copy Citation Text

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018)

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