• Chinese Optics Letters
  • Vol. 16, Issue 7, 071201 (2018)
Yunlong Zhu1、*, Julien Vaillant1、2, Guillaume Montay2, Manuel François2, Yassine Hadjar1, and Aurélien Bruyant1、**
Author Affiliations
  • 1ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
  • 2ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
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    DOI: 10.3788/COL201816.071201 Cite this Article Set citation alerts
    Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant. Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations[J]. Chinese Optics Letters, 2018, 16(7): 071201 Copy Citation Text show less

    Abstract

    Electronic speckle pattern interferometry (ESPI) and digital speckle pattern interferometry are well-established non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional (2D) or three-dimensional (3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a high-speed camera.
    E(x,y)=A1(x,y)ei[2πfct+θ1(x,y)+F1(t)]+A2(x,y)ei[2πfct+θ2(x,y)+F2(t)]+A3(x,y)ei[2πfct+θ3(x,y)].(1)

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    I(x,y)|E(x,y)|2=[A12(x,y)+A22(x,y)+A32(x,y)]+2A1(x,y)A2(x,y)cos[θ1(x,y)+F1(t)θ2(x,y)F2(t)]+2A1(x,y)A3(x,y)cos[θ1(x,y)+F1(t)θ3(x,y)]+2A2(x,y)A3(x,y)cos[θ2(x,y)+F2(t)θ3(x,y)].(2)

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    I(x,y)|E(x,y)|2=[A12(x,y)+A22(x,y)+A32(x,y)]+2A1(x,y)A2(x,y)cos[θ1(x,y)+F1(t)θ2(x,y)F2(t)]+2A1(x,y)A3(x,y)cos[θ1(x,y)+F1(t)θ3(x,y)]+2A2(x,y)A3(x,y)cos[θ2(x,y)+F2(t)θ3(x,y)],(3)

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    θ1(x,y)=θ1(x,y)+2πλ(n1ns)·u(x,y),(4)

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    θ2(x,y)=θ2(x,y)+2πλ(n2ns)·u(x,y),(5)

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    θ3(x,y)=θ3(x,y)+2πλ(n3ns)·u(x,y),(6)

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    F1(t)=2πf1t,(7)

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    F2(t)=2πf2t,(8)

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    I(x,y)|E(x,y)|2=[A12(x,y)+A22(x,y)+A32(x,y)]+2A1(x,y)A2(x,y)cos[θ1(x,y)θ2(x,y)+2π(f1f2)t]+2A1(x,y)A3(x,y)cos[θ1(x,y)θ3(x,y)+2πf1t]+2A2(x,y)A3(x,y)cos[θ2(x,y)θ3(x,y)+2πf2t].(9)

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    C1(x,y)=[θ1(x,y)θ3(x,y)][θ1(x,y)θ3(x,y)],(10)

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    C2(x,y)=[θ2(x,y)θ3(x,y)][θ2(x,y)θ3(x,y)],(11)

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    C1(x,y)=2πλ(n1n3)·u(x,y),(12)

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    C2(x,y)=2πλ(n2n3)·u(x,y).(13)

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    C1(x,y)=g·uy(x,y),(14)

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    C2(x,y)=g·ux(x,y),(15)

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    F1(t)=asin2πf1t,(16)

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    F2(t)=asin2πf2t,(17)

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    I(x,y)|E(x,y)|2=[A12(x,y)+A22(x,y)+A32(x,y)]+2A1(x,y)A2(x,y)cos[θ1(x,y)θ2(x,y)+asin2πf1tasin2πf2t]+2A1(x,y)A3(x,y)cos[θ1(x,y)θ3(x,y)+asin2πf1t]+2A2(x,y)A3(x,y)cos[θ2(x,y)θ3(x,y)+asin2πf2t].(18)

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    cos[θ1(x,y)θ2(x,y)+asin2πf1tasin2πf2t]=cos[θ1(x,y)θ2(x,y)]cos(asin2πf1t)cos(asin2πf2t)cos[θ1(x,y)θ2(x,y)]sin(asin2πf1t)sin(asin2πf2t)sin[θ1(x,y)θ2(x,y)]sin(asin2πf1t)cos(asin2πf2t)+sin[θ1(x,y)θ2(x,y)]cos(asin2πf1t)sin(asin2πf2t).(19)

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    cos(asin2πf1t)cos(asin2πf2t)=4p=1q=1J2p(a)J2q(a)cos(2p·2πf1t)cos(2q·2πf2t),(20)

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    cos(2p·2πf1t)cos(2q·2πf2t)=12cos(2p·2πf1t+2q·2πf2t)+12cos(2p·2πf1t2q·2πf2t),(21)

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    Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant. Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations[J]. Chinese Optics Letters, 2018, 16(7): 071201
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