Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu; Julien Vaillant; Guillaume Montay; Manuel François; Yassine Hadjar; Aurélien Bruyant

doi:10.3788/COL201816.071201

Journals >Chinese Optics Letters >Volume 16 >Issue 7 >Page 071201 > Article

Chinese Optics Letters
Vol. 16, Issue 7, 071201 (2018)

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu^1、*, Julien Vaillant^1、2, Guillaume Montay², Manuel François², Yassine Hadjar¹, and Aurélien Bruyant^1、**

Author Affiliations

¹ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

²ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

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DOI: 10.3788/COL201816.071201 Cite this Article Set citation alerts

Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant. Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations[J]. Chinese Optics Letters, 2018, 16(7): 071201 Copy Citation Text

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