• Chinese Optics Letters
  • Vol. 16, Issue 7, 071201 (2018)
Yunlong Zhu1,*, Julien Vaillant1,2, Guillaume Montay2, Manuel François2..., Yassine Hadjar1 and Aurélien Bruyant1,**|Show fewer author(s)
Author Affiliations
  • 1ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
  • 2ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
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    DOI: 10.3788/COL201816.071201 Cite this Article Set citation alerts
    Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018) Copy Citation Text show less
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    The article is cited by 7 article(s) from Web of Science.
    Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018)
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