Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, Zhanshan Wang. High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility[J]. High Power Laser Science and Engineering, 2021, 9(3): 03000e42
- High Power Laser Science and Engineering
- Vol. 9, Issue 3, 03000e42 (2021)
Fig. 1. Schematic of the multilayer KB microscope for high-resolution Ti flash radiography.
Fig. 2. Reflectivity measurement results of the KB multilayer by the X-ray diffractometer for grazing angles of (a) 1.000° and (b) 1.046°.
Fig. 3. Spectral response curves by fitting the reflectivity measurement results of the KB multilayer for grazing angles of (a) 1.000° and (b) 1.046°.
Fig. 4. Alignment parts of the multilayer KB microscope based on dual simulated balls.
Fig. 5. (a) Spatial resolution testing image and (b) calibrated result of the 600-mesh Au grid backlighted by a copper X-ray tube.
Fig. 6. Test result of the KB microscope by Ti flash radiography of the indirect-driven gold cone target.
|
Table 1. Optical parameters of the multilayer KB microscope.
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20