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    Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 10 >Page 1011004 > Article
    • Laser & Optoelectronics Progress
    • Vol. 58, Issue 10, 1011004 (2021)
    Progress in Weak-Value-Based Quantum Metrology and Tomography
    Liang Xu and Lijian Zhang*
    Author Affiliations
  • National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, Collaborative Innovation Center of Advanced Microstructures, and College of Engineering and Applied Sciences, Nanjing University, Nanjing, Jiangsu 210093, China
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    DOI: 10.3788/LOP202158.1011004 Cite this Article Set citation alerts
    Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004 Copy Citation Text show less
    Schematic for the weak-value amplification
    Fig. 1. Schematic for the weak-value amplification
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    General procedure of quantum metrology
    Fig. 2. General procedure of quantum metrology
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    Abstract
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    Figures&Tables (2)
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    References (193)
    Cited By (2)
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    Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004
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    Paper Information
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