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Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 10 >Page 1011004 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 10, 1011004 (2021)

Progress in Weak-Value-Based Quantum Metrology and Tomography

Liang Xu and Lijian Zhang^*

Author Affiliations

National Laboratory of Solid State Microstructures, Key Laboratory of Intelligent Optical Sensing and Manipulation, Collaborative Innovation Center of Advanced Microstructures, and College of Engineering and Applied Sciences, Nanjing University, Nanjing, Jiangsu 210093, China

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DOI: 10.3788/LOP202158.1011004 Cite this Article Set citation alerts

Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004 Copy Citation Text

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Liang Xu, Lijian Zhang. Progress in Weak-Value-Based Quantum Metrology and Tomography[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011004

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