• Journal of Semiconductors
  • Vol. 43, Issue 8, 082401 (2022)
Wenjing Xu1、2, Jie Chen1、*, Zhangqu Kuang3, Li Zhou1, Ming Chen1, and Chengbin Zhang1
Author Affiliations
  • 1Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Will Semiconductor Co. Ltd., Shanghai 201210, China
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    DOI: 10.1088/1674-4926/43/8/082401 Cite this Article
    Wenjing Xu, Jie Chen, Zhangqu Kuang, Li Zhou, Ming Chen, Chengbin Zhang. A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC[J]. Journal of Semiconductors, 2022, 43(8): 082401 Copy Citation Text show less
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    Wenjing Xu, Jie Chen, Zhangqu Kuang, Li Zhou, Ming Chen, Chengbin Zhang. A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC[J]. Journal of Semiconductors, 2022, 43(8): 082401
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