• Journal of Semiconductors
  • Vol. 43, Issue 8, 082002 (2022)
Yang Shen*, He Tian*, and Tianling Ren**
Author Affiliations
  • School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
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    DOI: 10.1088/1674-4926/43/8/082002 Cite this Article
    Yang Shen, He Tian, Tianling Ren. Simulation of MoS2 stacked nanosheet field effect transistor[J]. Journal of Semiconductors, 2022, 43(8): 082002 Copy Citation Text show less
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    Yang Shen, He Tian, Tianling Ren. Simulation of MoS2 stacked nanosheet field effect transistor[J]. Journal of Semiconductors, 2022, 43(8): 082002
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