• Journal of Semiconductors
  • Vol. 43, Issue 8, 082002 (2022)
Yang Shen*, He Tian*, and Tianling Ren**
Author Affiliations
  • School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
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    DOI: 10.1088/1674-4926/43/8/082002 Cite this Article
    Yang Shen, He Tian, Tianling Ren. Simulation of MoS2 stacked nanosheet field effect transistor[J]. Journal of Semiconductors, 2022, 43(8): 082002 Copy Citation Text show less
    (Color online) Energy band structures of MoS2 unit cell simulated with DFT showing the high symmetry points and a band gap EG = 1.78 eV.
    Fig. 1. (Color online) Energy band structures of MoS2 unit cell simulated with DFT showing the high symmetry points and a band gap EG = 1.78 eV.
    (Color online) (a) Schematic diagram of a 3-stacked NSFET. (b) Bird eye view and cross-sectional view along the channel of simulated structure in Sentaurus. (c) Simulation framework of this work. (d) Calibration of transfer curves to experimental data in log and linear form. Experimental data are from a 3-stacked NSFET (LG = 10 nm).
    Fig. 2. (Color online) (a) Schematic diagram of a 3-stacked NSFET. (b) Bird eye view and cross-sectional view along the channel of simulated structure in Sentaurus. (c) Simulation framework of this work. (d) Calibration of transfer curves to experimental data in log and linear form. Experimental data are from a 3-stacked NSFET (LG = 10 nm).
    (Color online) Electrostatic performance comparison of Si and MoS2 based 3-stacked NSFET. (a) Transfer characteristics. (b) Roll-off. (c) DIBL. (d) SS.
    Fig. 3. (Color online) Electrostatic performance comparison of Si and MoS2 based 3-stacked NSFET. (a) Transfer characteristics. (b) Roll-off. (c) DIBL. (d) SS.
    (Color online) (a) Comparison of Si and MoS2 based 3-stacked NSFET in terms of CG–VG characteristic. (b) CG vs VG with different sheet widths. (c) CG vs VG with different number of stacks. (d) CG, CGS, CGD vs VD, separately.
    Fig. 4. (Color online) (a) Comparison of Si and MoS2 based 3-stacked NSFET in terms of CGVG characteristic. (b) CG vs VG with different sheet widths. (c) CG vs VG with different number of stacks. (d) CG, CGS, CGD vs VD, separately.
    EG (eV) Μ (cm2/(V·s)) me*mh*T (nm) χ (eV) ε
    1.78100~0.501m0~0.588m00.654.24
    Table 1. Parameters used in this work.
    Yang Shen, He Tian, Tianling Ren. Simulation of MoS2 stacked nanosheet field effect transistor[J]. Journal of Semiconductors, 2022, 43(8): 082002
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