School of Integrated Circuits and Beijing National Research Center for Information Science and Technology (BNRist), Tsinghua University, Beijing 100084, China
Yang Shen, He Tian, Tianling Ren. Simulation of MoS2 stacked nanosheet field effect transistor[J]. Journal of Semiconductors, 2022, 43(8): 082002
Copy Citation Text
Fig. 2. (Color online) (a) Schematic diagram of a 3-stacked NSFET. (b) Bird eye view and cross-sectional view along the channel of simulated structure in Sentaurus. (c) Simulation framework of this work. (d) Calibration of transfer curves to experimental data in log and linear form. Experimental data are from a 3-stacked NSFET (LG = 10 nm).
Fig. 3. (Color online) Electrostatic performance comparison of Si and MoS2 based 3-stacked NSFET. (a) Transfer characteristics. (b) Roll-off. (c) DIBL. (d) SS.
Fig. 4. (Color online) (a) Comparison of Si and MoS2 based 3-stacked NSFET in terms of CG–VG characteristic. (b) CG vs VG with different sheet widths. (c) CG vs VG with different number of stacks. (d) CG, CGS, CGD vs VD, separately.