Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method

Haojian Xing; Zenghe Yin; Jie Zhang; Yong Zhu

doi:10.3788/LOP57.030002

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 3 >Page 030002 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 3, 030002 (2020)

Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method

Haojian Xing, Zenghe Yin, Jie Zhang^*, and Yong Zhu

Author Affiliations

Key Laboratory for Optoelectronic Technology & System, Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China

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DOI: 10.3788/LOP57.030002 Cite this Article Set citation alerts

Haojian Xing, Zenghe Yin, Jie Zhang, Yong Zhu. Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method[J]. Laser & Optoelectronics Progress, 2020, 57(3): 030002 Copy Citation Text

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Haojian Xing, Zenghe Yin, Jie Zhang, Yong Zhu. Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method[J]. Laser & Optoelectronics Progress, 2020, 57(3): 030002

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