• Laser & Optoelectronics Progress
  • Vol. 57, Issue 3, 030002 (2020)
Haojian Xing, Zenghe Yin, Jie Zhang*, and Yong Zhu
Author Affiliations
  • Key Laboratory for Optoelectronic Technology & System, Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China
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    DOI: 10.3788/LOP57.030002 Cite this Article Set citation alerts
    Haojian Xing, Zenghe Yin, Jie Zhang, Yong Zhu. Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method[J]. Laser & Optoelectronics Progress, 2020, 57(3): 030002 Copy Citation Text show less

    Abstract

    Surface-enhanced Raman scattering (SERS) is a highly efficient molecular spectroscopy technique widely used to detect trace species in studies in many fields such as chemistry, life sciences, and pharmaceutical analysis. However, the non-uniformity of “hot spots,” instability of chemical effects, and uncertainty of the number of molecules increase the volatility of Raman signals, which presents difficulty in their use for quantitative analysis. This paper introduces the principle of an internal standard method, improvement of substrate performance, and the modes for adding three internal standards, including external addition mode, core-internal standard-shell modes, and self-calibrating substrate mode, from the following four aspects: “hot spot” effect, chemical effect, molecular adsorption, and internal standard addition mode.
    Haojian Xing, Zenghe Yin, Jie Zhang, Yong Zhu. Quantitative Analysis of Surface-Enhanced Raman Scattering Based on Internal Standard Method[J]. Laser & Optoelectronics Progress, 2020, 57(3): 030002
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