Jan Ruschel1、*, Johannes Glaab1, Batoul Beidoun1, Neysha Lobo Ploch1, Jens Rass1, Tim Kolbe1, Arne Knauer1, Markus Weyers1, Sven Einfeldt1, and Michael Kneissl1、2
Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl. Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes[J]. Photonics Research, 2019, 7(7): B36
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Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl. Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes[J]. Photonics Research, 2019, 7(7): B36