• Photonics Research
  • Vol. 7, Issue 7, B36 (2019)
Jan Ruschel1,*, Johannes Glaab1, Batoul Beidoun1, Neysha Lobo Ploch1..., Jens Rass1, Tim Kolbe1, Arne Knauer1, Markus Weyers1, Sven Einfeldt1 and Michael Kneissl1,2|Show fewer author(s)
Author Affiliations
  • 1Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
  • 2Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, EW 6-1, 10623 Berlin, Germany
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    DOI: 10.1364/PRJ.7.000B36 Cite this Article Set citation alerts
    Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl, "Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes," Photonics Res. 7, B36 (2019) Copy Citation Text show less
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    The article is cited by 49 article(s) from Web of Science.
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    Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl, "Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes," Photonics Res. 7, B36 (2019)
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