Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes

Jan Ruschel; Johannes Glaab; Batoul Beidoun; Neysha Lobo Ploch; Jens Rass; Tim Kolbe; Arne Knauer; Markus Weyers; Sven Einfeldt; Michael Kneissl

doi:10.1364/PRJ.7.000B36

Journals >Photonics Research >Volume 7 >Issue 7 >Page B36 > Article

Photonics Research
Vol. 7, Issue 7, B36 (2019)

Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes

Jan Ruschel^1、*, Johannes Glaab¹, Batoul Beidoun¹, Neysha Lobo Ploch¹, Jens Rass¹, Tim Kolbe¹, Arne Knauer¹, Markus Weyers¹, Sven Einfeldt¹, and Michael Kneissl^1、2

Author Affiliations

¹Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany

²Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, EW 6-1, 10623 Berlin, Germany

show less

DOI: 10.1364/PRJ.7.000B36 Cite this Article Set citation alerts

Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl. Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes[J]. Photonics Research, 2019, 7(7): B36 Copy Citation Text

EndNote(RIS)

BibTex

Plain Text

show less

Abstract

The impact of operation current on the degradation behavior of 310 nm UV LEDs is investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current densities from 34 to

201 A / {cm}^{2}

. To separate the impact of current from that of temperature, the junction temperature is kept constant by adjusting the heat sink temperature. Higher current was found to strongly accelerate the optical power reduction during operation. A mathematical model for lifetime prediction is introduced. It indicates that lifetime is inversely proportional to the cube of the current density, suggesting the involvement of Auger recombination.