Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
polarization
nir
lithium niobate
optical coherence tomography
Journals >
Laser & Optoelectronics Progress >
Volume 57 >
Issue 10 >
Page 101509 > Article
Laser & Optoelectronics Progress
Vol. 57, Issue 10, 101509 (2020)
Inertial Navigation Aided Image Feature Matching Method
Bin Wu and Xuri Wang
*
Author Affiliations
State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
show less
DOI:
10.3788/LOP57.101509
Cite this Article
Set citation alerts
Bin Wu, Xuri Wang. Inertial Navigation Aided Image Feature Matching Method[J]. Laser & Optoelectronics Progress, 2020, 57(10): 101509
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 19, 2024
Citation counts are provided from Researching.
The article is cited by
3
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (15)
Equations (0)
References (22)
Cited By (3)
Get Citation
Copy Citation Text
Bin Wu, Xuri Wang. Inertial Navigation Aided Image Feature Matching Method[J]. Laser & Optoelectronics Progress, 2020, 57(10): 101509
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Machine Vision
Received: Nov. 9, 2019
Accepted: Dec. 6, 2019
Published Online: May. 8, 2020
The Author Email: Wang Xuri (wangxuri@tju.edu.cn)
DOI:
10.3788/LOP57.101509
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm