• Laser & Optoelectronics Progress
  • Vol. 58, Issue 19, 1922002 (2021)
Zehong Wan1, Enkang Cui1, Shengtao Yu2, Yu Lei2, Chengqun Gui1, and Shengjun Zhou1、2、*
Author Affiliations
  • 1The Institute of Technological Science, Wuhan University, Wuhan , Hubei 430072, China
  • 2School of Power and Mechanical Engineering, Wuhan University, Wuhan , Hubei 430072, China
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    DOI: 10.3788/LOP202158.1922002 Cite this Article Set citation alerts
    Zehong Wan, Enkang Cui, Shengtao Yu, Yu Lei, Chengqun Gui, Shengjun Zhou. Effects of Reactive Ion Etching Parameters on Etching Rate and Surface Roughness of 4H-SiC[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1922002 Copy Citation Text show less
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    Zehong Wan, Enkang Cui, Shengtao Yu, Yu Lei, Chengqun Gui, Shengjun Zhou. Effects of Reactive Ion Etching Parameters on Etching Rate and Surface Roughness of 4H-SiC[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1922002
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