• Infrared and Laser Engineering
  • Vol. 50, Issue 11, 20210072 (2021)
Zhenxiang Wang1 and Kai Hu2
Author Affiliations
  • 1School of Microelectronics, Tianjin University, Tianjin 300072, China
  • 2School of Integrated Circuit Science and Engineering, Tianjin University of Technology, Tianjin 300072, China
  • show less
    DOI: 10.3788/IRLA20210072 Cite this Article
    Zhenxiang Wang, Kai Hu. A high performance TDI readout circuit for scanning type infrared sensor[J]. Infrared and Laser Engineering, 2021, 50(11): 20210072 Copy Citation Text show less
    References

    [1] C C Hsieh, C Y Wu, F W Jih, . et al. Focal-plane-arrays and CMOS readout techniques of infrared imaging systems. IEEE Transactions on Circuits and Systems for Video Technology, 7, 594-605(1997).

    [2] Byunghyuk Kim, Hee Chul Lee. Smart TDI readout circuit for long-wavelength IR detector. Electronics Letters, 38, 854-855(2002).

    [3] H Hanamura, M Aoki, T Masuhara, et al. Operation of bulk CMOS devices at very low temperatures. IEEE Journal of Solid-State Circuits, 21, 484-490(1986).

    [4] Tsai Fukai, Huang Hongyi, Dai Likuo, et al. A timedelayintegration CMOS readout circuit f IR scanning[C]International Conference on Electronics, Circuits Systems, 2002, 1: 347350.

    [5] Sizov F F, Derkach Y P, Kononenko Y G, et al. Readout device processing electronics f IR linear focal plane arrays[C]Proceedings of SPIE, 1999, 3698: 816825.

    [6] Chen L P, Hewitt M J, Gulbransen D J, et al. Overview of advances in highperfmance ROIC designs f use with IRFPAs[C]Proceedings of SPIE, 2000, 4028: 124138.

    [7] R G Carvajal, J Ramírez-Angulo, A J López-Martín, et al. The flipped voltage follower: A useful cell for low-voltage low-power circuit design. IEEE Transactions on Circuits and Systems I : Regular Papers, 52, 1276-1291(2005).

    [8] M Yavari. Single-stage class AB operational amplifier for SC circuits. Electronics Letters, 46, 977-979(2010).

    [9] Kayahan Huseyin, Yazici Melik, Ceylan Omer, et al. Design of ROIC based on switched capacit TDI f MCT LWIR focal plane arrays[C]Proceedings of SPIE, 2011, 8012: 80120M.

    [10] Ceylan Omer, Kayahan Huseyin, Yazici Melik, et al. Design of 90×8 ROIC with pixel level digital TDI implementation f scanning type LWIR FPAs[C]Proceedings of SPIE, 2013, 8704: 870432.

    [11] Huseyin Kayahan, Omer Ceylan, Melik Yazici, et al. Wide range, process and temperature compensated voltage controlled current source. IEEE Transactions on Circuits and Systems I: Regular Papers, 60, 1345-1353(2013).

    Zhenxiang Wang, Kai Hu. A high performance TDI readout circuit for scanning type infrared sensor[J]. Infrared and Laser Engineering, 2021, 50(11): 20210072
    Download Citation