• Infrared and Laser Engineering
  • Vol. 50, Issue 11, 20210072 (2021)
Zhenxiang Wang1 and Kai Hu2
Author Affiliations
  • 1School of Microelectronics, Tianjin University, Tianjin 300072, China
  • 2School of Integrated Circuit Science and Engineering, Tianjin University of Technology, Tianjin 300072, China
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    DOI: 10.3788/IRLA20210072 Cite this Article
    Zhenxiang Wang, Kai Hu. A high performance TDI readout circuit for scanning type infrared sensor[J]. Infrared and Laser Engineering, 2021, 50(11): 20210072 Copy Citation Text show less
    Block diagram of detector and ROIC
    Fig. 1. Block diagram of detector and ROIC
    Detail circuit diagram of CTIA
    Fig. 2. Detail circuit diagram of CTIA
    Simulated linearity of CTIA
    Fig. 3. Simulated linearity of CTIA
    TDI schematic
    Fig. 4. TDI schematic
    Timing diagram of TDI
    Fig. 5. Timing diagram of TDI
    Simplified diagram of output buffer
    Fig. 6. Simplified diagram of output buffer
    Odd and even column layout of ROIC
    Fig. 7. Odd and even column layout of ROIC
    Captured output voltage from CTIA pixel circuit
    Fig. 8. Captured output voltage from CTIA pixel circuit
    Input 1/VInput 2/VInput 3/VOutput/V
    0.50.510.66
    0.80.810.86
    1110.99
    1.21.211.13
    1.51.511.16
    Table 1. Injected input & captured output from TDI stage
    Zhenxiang Wang, Kai Hu. A high performance TDI readout circuit for scanning type infrared sensor[J]. Infrared and Laser Engineering, 2021, 50(11): 20210072
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