• Laser & Optoelectronics Progress
  • Vol. 59, Issue 18, 1836001 (2022)
Jiawei Shen1, Na Sun2, Fangjian Xing1、*, Zixian Guo1, and Junpeng Shi1
Author Affiliations
  • 1School of Computer and Electronic Information/School of Artificial Intelligence, Nanjing Normal University, Nanjing 210023, Jiangsu, China
  • 2School of Physics and Technology, Nanjing Normal University, Nanjing 210023, Jiangsu, China
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    DOI: 10.3788/LOP202259.1836001 Cite this Article Set citation alerts
    Jiawei Shen, Na Sun, Fangjian Xing, Zixian Guo, Junpeng Shi. [J]. Laser & Optoelectronics Progress, 2022, 59(18): 1836001 Copy Citation Text show less

    Abstract

    The details of cross-sectional images based on Fourier domain optical coherence tomography play an important role that is limited to nonuniform sampling, spectral dispersion, inverse discrete Fourier transform (IDFT), and noise. In this section, we propose a method for emphasizing axial details to the greatest extent possible. After removing spectral dispersion, uniform discretization in the wavenumber domain is performed based on two interferograms via a specified offset in depth, with no spectrum calibration. The sampling number in IDFT is optimized to improve axial sensitivity up to 1.62 dB. The proposed process has the advantage of being based on numerical computation rather than hardware calibration, which benefits cost, accuracy, and efficiency.
    I(k)=A(Δz)cos{2k(xi)Δz+φd[k(xi)]+φn[k(xi)]}
    φ(xi)=arctanI˜[k(xi)]I[k(xi)]
    Δφ(xi)=2k(xi)Δz'+Δφn[k(xi)] .
    k(xi)=Δφ(xi)2Δz' .
    I(k')=A(Δz)cos{2k'(xi)Δz+φd[k'(xi)]+φn[k'(xi)]} .
    I(k')=A(Δz)cos{2k'(xi)Δz+φn[k'(xi)]} .
    i(Δz)=1Ni=1NI[k'(xi)]ejΔzk'(xi)2πN
    Jiawei Shen, Na Sun, Fangjian Xing, Zixian Guo, Junpeng Shi. [J]. Laser & Optoelectronics Progress, 2022, 59(18): 1836001
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