• Laser & Optoelectronics Progress
  • Vol. 57, Issue 20, 201502 (2020)
Youwei Liu1、*, Shaosheng Fan1, Lijun Tang2, Yong Feng2, and Haotao Li2
Author Affiliations
  • 1School of Electrical & Information Engineering, Changsha University of Science & Technology, Changsha, Hunan 410114, China;
  • 2Electric Power Research Institute, Yunnan Power Grid Co., Ltd., Kunming, Yunnan 650217, China
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    DOI: 10.3788/LOP57.201502 Cite this Article Set citation alerts
    Youwei Liu, Shaosheng Fan, Lijun Tang, Yong Feng, Haotao Li. Visual Detection of Stockbridge Damper Slip on Power Transmission Lines Based on Key Points[J]. Laser & Optoelectronics Progress, 2020, 57(20): 201502 Copy Citation Text show less

    Abstract

    This study proposes a method for detecting slipping of stockbridge dampers based on key point training and learning. First, an improved SSD model is used to identify and locate the stockbridge damper. Thereafter, the key points of the stockbridge damper are selected, the MobileNetV3 network is trained, and the input area is set by the upper positioning results of the stockbridge damper to realize the detection of key points. Finally, discrimination rules are formulated according to the characteristics of line images. For m(m≥2) stockbridge dampers, the geometric constraint relationship among the key points is used to realize determination. For a single stockbridge damper, the EPnP algorithm is used to estimate the multiangle pose of the camera. Moreover, the spatial coordinates of the nearest points are obtained from the relationship between the pose and the pixel coordinates of the key point of the damp to determine whether the distance between the nearest points and the stockbridge damper is within the threshold range. The experimental results show that the proposed method can effectively identify slip faults and provide new ideas for detecting defects in transmission lines.
    Youwei Liu, Shaosheng Fan, Lijun Tang, Yong Feng, Haotao Li. Visual Detection of Stockbridge Damper Slip on Power Transmission Lines Based on Key Points[J]. Laser & Optoelectronics Progress, 2020, 57(20): 201502
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