Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C. Trager-Cowan; A. Alasmari; W. Avis; J. Bruckbauer; P. R. Edwards; B. Hourahine; S. Kraeusel; G. Kusch; R. Johnston; G. Naresh-Kumar; R. W. Martin; M. Nouf-Allehiani; E. Pascal; L. Spasevski; D. Thomson; S. Vespucci; P. J. Parbrook; M. D. Smith; J. Enslin; F. Mehnke; M. Kneissl; C. Kuhn; T. Wernicke; S. Hagedorn; A. Knauer; V. Kueller; S. Walde; M. Weyers; P.-M. Coulon; P. A. Shields; Y. Zhang; L. Jiu; Y. Gong; R. M. Smith; T. Wang; A. Winkelmann

doi:10.1364/PRJ.7.000B73

Journals >Photonics Research >Volume 7 >Issue 11 >Page B73 > Article

Photonics Research
Vol. 7, Issue 11, B73 (2019)

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

C. Trager-Cowan^1、*, A. Alasmari¹, W. Avis¹, J. Bruckbauer¹, P. R. Edwards¹, B. Hourahine¹, S. Kraeusel¹, G. Kusch¹, R. Johnston¹, G. Naresh-Kumar¹, R. W. Martin¹, M. Nouf-Allehiani¹, E. Pascal¹, L. Spasevski¹, D. Thomson¹, S. Vespucci¹, P. J. Parbrook², M. D. Smith², J. Enslin³, F. Mehnke³, M. Kneissl^3、4, C. Kuhn³, T. Wernicke³, S. Hagedorn⁴, A. Knauer⁴, V. Kueller⁴, S. Walde⁴, M. Weyers⁴, P.-M. Coulon⁵, P. A. Shields⁵, Y. Zhang⁶, L. Jiu⁶, Y. Gong⁶, R. M. Smith⁶, T. Wang⁶, and A. Winkelmann^1、7

Author Affiliations

¹Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, UK

²Tyndall National Institute, University College Cork, Cork T12 R5CP, Ireland

³Institute of Solid State Physics, Technische Universität Berlin, 10623 Berlin, Germany

⁴Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, 12489 Berlin, Germany

⁵Department of Electronic and Electrical Engineering, Centre of Nanoscience & Nanotechnology, University of Bath, Bath BA2 7AY, UK

⁶Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, UK

⁷Laser Components Department, Laser Zentrum Hannover e.V., 30419 Hannover, Germany

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DOI: 10.1364/PRJ.7.000B73 Cite this Article Set citation alerts

C. Trager-Cowan, A. Alasmari, W. Avis, J. Bruckbauer, P. R. Edwards, B. Hourahine, S. Kraeusel, G. Kusch, R. Johnston, G. Naresh-Kumar, R. W. Martin, M. Nouf-Allehiani, E. Pascal, L. Spasevski, D. Thomson, S. Vespucci, P. J. Parbrook, M. D. Smith, J. Enslin, F. Mehnke, M. Kneissl, C. Kuhn, T. Wernicke, S. Hagedorn, A. Knauer, V. Kueller, S. Walde, M. Weyers, P.-M. Coulon, P. A. Shields, Y. Zhang, L. Jiu, Y. Gong, R. M. Smith, T. Wang, A. Winkelmann. Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films[J]. Photonics Research, 2019, 7(11): B73 Copy Citation Text

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