• Journal of Infrared and Millimeter Waves
  • Vol. 41, Issue 4, 659 (2022)
Meng CAO1、2, Bin YU1, Xiang ZHANG2, Cheng-Gang XU2, Shan ZHANG3, Li-Ying SUN4、*, Xiao-Hong TAN2, Yu-Cheng JIANG5, Jia-Wei DOU2, and Lin-Jun WANG2、6
Author Affiliations
  • 1State Key Laboratory of Nuclear Power Safety Monitoring Technology and Equipment,China Nuclear Power Engineering Co.,Ltd.,Shenzhen 518172,China
  • 2School of Materials Science and Engineering,Shanghai University,Shanghai,200072,China
  • 3Key Laboratory of infrared imaging materials and detectors,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai,200083,China
  • 4Intensive Care Unit,Yangpu District Shidong Hospital,,Shanghai 200438,China
  • 5School of Physical Science and Technology,Suzhou University of Science and Technology,Suzhou 215009,China
  • 6Zhejiang Institute of Advanced Materials,SHU,Jiashan314113,China
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    DOI: 10.11972/j.issn.1001-9014.2022.04.001 Cite this Article
    Meng CAO, Bin YU, Xiang ZHANG, Cheng-Gang XU, Shan ZHANG, Li-Ying SUN, Xiao-Hong TAN, Yu-Cheng JIANG, Jia-Wei DOU, Lin-Jun WANG. Photoelectrochemical properties of sputtered n-type CdTe thin films[J]. Journal of Infrared and Millimeter Waves, 2022, 41(4): 659 Copy Citation Text show less
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    Meng CAO, Bin YU, Xiang ZHANG, Cheng-Gang XU, Shan ZHANG, Li-Ying SUN, Xiao-Hong TAN, Yu-Cheng JIANG, Jia-Wei DOU, Lin-Jun WANG. Photoelectrochemical properties of sputtered n-type CdTe thin films[J]. Journal of Infrared and Millimeter Waves, 2022, 41(4): 659
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