• Laser & Optoelectronics Progress
  • Vol. 56, Issue 14, 142401 (2019)
Zhengang Yan1, Weiping Sun1, Jie Li1, Jiangpeng Wu1, Xinhong Zhu1, Mengdi Yuan1, Liang Xue2, and Keding Yan3、*
Author Affiliations
  • 1 Xi'an Modern Control Technology Institute, Xi'an, Shaanxi 710065, China
  • 2 College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China
  • 3 School of Electronic Information Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, China
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    DOI: 10.3788/LOP56.142401 Cite this Article Set citation alerts
    Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401 Copy Citation Text show less
    References

    [1] Gong L, Wu Z S, Ge C X et al. Composite light scattering properties between slightly rough optical surface and multi-body particles[J]. Chinese Journal of Lasers, 43, 1203001(2016).

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    [10] Yan K D, Wang S Y, Jiang S et al. Full angular Stokes vectors of light scattering from two-dimensional randomly rough surfaces by Kirchhoff approximation method[J]. Journal of Optics, 16, 105714(2014).

    [11] Yan K D, Wang S Y, Jiang S et al. Calculation and analysis of Mueller matrix in light scattering detection[J]. Chinese Optics Letters, 12, 092901(2014). http://www.opticsjournal.net/Articles/Abstract?aid=OJ140819000023UqXtZw

    [12] Hsieh C Y. Study of out of plane bistatic scattering from rough dielectric surfaces[J]. IEE Proceedings-Microwaves, Antennas and Propagation, 148, 157-162(2001).

    [13] He Z C. Modeling and calculation of electromagnetic scattering of vegetation on rough terrain[D]. Chengdu: University of Electronic Science and Technology of China(2018).

    Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401
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