• Laser & Optoelectronics Progress
  • Vol. 56, Issue 14, 142401 (2019)
Zhengang Yan1, Weiping Sun1, Jie Li1, Jiangpeng Wu1, Xinhong Zhu1, Mengdi Yuan1, Liang Xue2, and Keding Yan3、*
Author Affiliations
  • 1 Xi'an Modern Control Technology Institute, Xi'an, Shaanxi 710065, China
  • 2 College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China
  • 3 School of Electronic Information Engineering, Xi'an Technological University, Xi'an, Shaanxi 710021, China
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    DOI: 10.3788/LOP56.142401 Cite this Article Set citation alerts
    Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401 Copy Citation Text show less

    Abstract

    Based on Kirchhoff approximation method, a numerical computation model of Mueller matrix full angle distribution is constructed herein, and Mueller matrix distributions of random rough surfaces of metals and dielectrics are calculated. Results show that there are obvious difference between Mueller matrix distributions of metals and dielectrics; six components of the Mueller matrix of dielectric surfaces are close to 0, whereas those of metal surfaces are non-zero; additionally, the difference is independent of the surface roughness. This difference can act as the robust criterion to distinguish metal and dielectric targets, and can provide new tools in target detection and recognition.
    Zhengang Yan, Weiping Sun, Jie Li, Jiangpeng Wu, Xinhong Zhu, Mengdi Yuan, Liang Xue, Keding Yan. Identification of Metals and Dielectrics Based on Mueller Matrix[J]. Laser & Optoelectronics Progress, 2019, 56(14): 142401
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