• Laser & Optoelectronics Progress
  • Vol. 58, Issue 17, 1714004 (2021)
Xinpeng Li1、2, Deyang Yu1、*, Qikun Pan1, Ranran Zhang1、2, Kuo Zhang1, Jin Guo1, and Fei Chen1
Author Affiliations
  • 1State Key Laboratory of Laser Interaction with Matter, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun , Jilin 130033, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/LOP202158.1714004 Cite this Article Set citation alerts
    Xinpeng Li, Deyang Yu, Qikun Pan, Ranran Zhang, Kuo Zhang, Jin Guo, Fei Chen. Beam Pointing Stability of Extreme Ultraviolet Lithography Light Source System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1714004 Copy Citation Text show less

    Abstract

    A beam alignment system for extreme ultraviolet lithography light source system is designed to meet the requirement of beam pointing stability of extreme ultraviolet lithography light source system and ensure the conversion efficiency of extreme ultraviolet light. The alignment system is composed of two parts, the beam jitter detection module and the beam alignment module. By analyzing the beam jitter mechanism and beam control principle, a closed-loop alignment system with detection and control is built based on the virtual instrument development software LabVIEW. The experimental results show that after the beam passes through the alignment system, the jitter amplitude in the horizontal direction is less than 2 μm, the jitter amplitude in the vertical direction is less than 4 μm, and the pointing stability is less than 6 μrad, which meets the requirements of the light source system for the beam pointing stability.
    Δy=θ×f
    ξi2=ξxi2+ξyi2=ξxi'-X¯2+ξyi'-Y¯2
    Sξ=iξi2/n-1
    ξα=2Sξ/f
    ΔX1ΔY1ΔX2ΔY2=KΔUX1ΔUY1ΔUX2ΔUY2
    ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2=A11A12A13A14A12A22A23A24A31A32A33A34A41A42A43A44ΔX1ΔY1ΔX2ΔY2
    ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2=AΔX1ΔY1ΔX2ΔY2=AKΔUX1ΔUY1ΔUX2ΔUY2=BΔUX1ΔUY1ΔUX2ΔUY2
    ΔUX1ΔUY1ΔUX2ΔUY2=B-1ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2
    ΔUX1ΔUY1ΔUX2ΔUY2=ggain·B-1ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2
    ΔUX1kΔUY1kΔUX2kΔUY2k=KP·B-1ΔCCAMX1k-ΔCCAMX1k-1ΔCCAMY1k-ΔCCAMY1k-1ΔCCAMX2k-ΔCCAMX2k-1ΔCCAMY2k-ΔCCAMY2k-1+KI*B-1ΔCCAMX1kΔCCAMY1kΔCCAMX2kΔCCAMY2k
    ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2=B11B12B13B14B12B22B23B24B31B32B33B34B41B42B43B44ΔUX1ΔUY1ΔUX2ΔUY2
    ΔCCAMX1ΔCCAMY1ΔCCAMX2ΔCCAMY2=B11B12B13B14B12B22B23B24B31B32B33B34B41B42B43B44ΔUX1000
    Xinpeng Li, Deyang Yu, Qikun Pan, Ranran Zhang, Kuo Zhang, Jin Guo, Fei Chen. Beam Pointing Stability of Extreme Ultraviolet Lithography Light Source System[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1714004
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