[1] Bartoil F. J., Esterowitz L., Kruer M. R. et al.. Thermal recovery processes in laser irradiated HgCdTe(PC) detectors[J]. Appl. Opt., 1975, 14(10): 2499~2507
[2] Bartoil F. J., Esterowitz L., Allen R. et al.. A generalized thermal model for laser damage in infrared detectors[J]. Appl. Phys., 1976, 47(10): 2875~2881
[3] Janesick J., Elliott T., Pool F.. Radiation damage in scientific charge-coupled devices[J]. IEEE Transactions on Nuclear Science, 1989, 36(1): 572~578
[4] Meidinger N., Schmalhofer B., Struder L.. Alpha particle, proton and X-ray damage in fully depleted PN-junction CCD detectors for X-ray imaging and spectroscopy[J]. IEEE Transactions on Nuclear Science, 1998, 45(6): 2849~2856
[5] Stefanov K. D., Tsukamoto T., Miyamoto A. et al.. Electron and neutron radiation damage effects on a two-phase CCD[J]. IEEE Transactions on Nuclear Science, 2000, 47(3): 1280~1291
[8] Guo Shaofeng, Cheng Xiang′ai, Fu Xiquan et al.. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19(17): 1783~1786
[12] Kazuya Yonemoto. CCD/CMOS Image Sensor No Kiso to Ouyou[M]. Chen Rongting, Peng Meigui tranl., Beijing: Science Press, 1980, 113~114
[13] Li F. M., Nixon O., Nathan A.. Degradation behavior and damage mechanisms of CCD image sensor with deep-UV laser radiation[J]. IEEE Transactions on Electron Devices, 2004, 51(12): 2229~2236