Aiming at the phenomenon that irreversible bright line and all-field blank screen happens in the CCD irradiated by pulsed laser, the resistance between driving electrodes and substrate is measured, damage micro-morphological image of different layers in the facular area is observed, exported waveforms are detected, and the damage mechanisms for CCD are analyzed in detail. The results show that high power pulse laser induces the ablation at different layers of CCD, and increases the dark current and leakage current, which leads the failure of the device.