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    Journals >Laser & Optoelectronics Progress >Volume 54 >Issue 12 >Page 121202 > Article
    • Laser & Optoelectronics Progress
    • Vol. 54, Issue 12, 121202 (2017)
    Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique
    Sui Xiaole, Xiao Xia*, Qi Haiyang, and Kong Tao
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    DOI: 10.3788/lop54.121202 Cite this Article Set citation alerts
    Sui Xiaole, Xiao Xia, Qi Haiyang, Kong Tao. Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121202 Copy Citation Text show less
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    Article index updated: May. 22, 2024
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    Sui Xiaole, Xiao Xia, Qi Haiyang, Kong Tao. Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121202
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