• Journal of Semiconductors
  • Vol. 40, Issue 4, 042102 (2019)
Ruyue Cao1、2, Hui-Xiong Deng1、2, Jun-Wei Luo1、2、3, and Su-Huai Wei4
Author Affiliations
  • 1State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China
  • 4Beijing Computational Science Research Center, Beijing 100193, China
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    DOI: 10.1088/1674-4926/40/4/042102 Cite this Article
    Ruyue Cao, Hui-Xiong Deng, Jun-Wei Luo, Su-Huai Wei. Origin of the anomalous trends in band alignment of GaX/ZnGeX2 (X = N, P, As, Sb) heterojunctions[J]. Journal of Semiconductors, 2019, 40(4): 042102 Copy Citation Text show less
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    Ruyue Cao, Hui-Xiong Deng, Jun-Wei Luo, Su-Huai Wei. Origin of the anomalous trends in band alignment of GaX/ZnGeX2 (X = N, P, As, Sb) heterojunctions[J]. Journal of Semiconductors, 2019, 40(4): 042102
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