[1] Underwood J H,Barbee T W.Layered synthetic microstructure as Bragg diffractors for X-ray and extreme ultraviolet: Theory and predicted performance.Appl.Opt.,1981,20;17:3027～3034

[2] Heald S M,Chen H,Tranguada J M.Glancing-angle-extended X-ray-absorption fine structure and reflectivity studies of interfacial regions.Phys.Rew.;B,1988,38;2:1016～1025

[3] Voorma H J,Louis E,Koster N B et al..Characterization of multilayers by Fourier analysis of X-ray reflectivity.J.Appl.Phys.,1997,81;9:6112～6119