• Acta Optica Sinica
  • Vol. 20, Issue 9, 1208 (2000)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Approximate Method for Calculating Thickness of Metal Multilayer Interface[J]. Acta Optica Sinica, 2000, 20(9): 1208 Copy Citation Text show less

    Abstract

    The metal multilayers were sputtering deposited on K9 glass,and their simple structural parameters were obtained by the small angle X-ray diffraction.A formula for calculating the thickness of transfer layers is proposed,and the calculated results of samples is presented.Compared to the results obtained from the fitting method,these results are similar.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Approximate Method for Calculating Thickness of Metal Multilayer Interface[J]. Acta Optica Sinica, 2000, 20(9): 1208
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